In situ resistivity studies of 200MeV 107Ag14+ion irradiated n-GaAs epitaxial layers, R. Singh, S.K. Arora, J.P. Singh, Renu Tyagi, S.K. Agarwal and D. Kanjilal, Vacuum, Vol. 65 (1) 39 (2002).
Swift heavy ion-induced recrysallization of Silicon-on-Insulator (SOI) structures, G.S. Virdi, B.C. Pathak, D.K. Avasthi and D.Kanjilal, Nucl. Instr. and Methods in Phys. Res. B,187 (2), 189 (2002).
Swift Heavy Ion-Induced Modification And Track Formation In Materials, D. Kanjilal, Current Science, 80 (12), 1560 (2001).
Low energy ion implantation and high energy heavy ion irradiation in C60 films, K.L. Narayanan, M. Yamaguchi, N. Dharmarasu, N. Kojima and D. Kanjilal, Nucl. Instr. and Methods in Phys. Res. B,178 (1-4), 301 (2001).
Development of An In-Situ Ultra-High-Vacuum Scanning Tunneling Microscope in the Beamline of 15 Mv Tandem Accelerator For Studies Of Surface Modification by Swift Heavy Ion Beam, A. Tripathi, J. P. Singh, R. Ahuja, R. N. Dutt,D. Kanjilal, A. Guha, A. Biswas and A. K. Raychaudhuri, Rev. Sci. Instr. 72(10), 3884 (2001).
Experimental Investigation of 200 Mev 107 Ag14+ Ion Induced Modifications in n-GaAs epitaxial layer by in situ resistivity and by in-situ resistivity and hall measurements, R. Singh, S. K. Arora, J. P. Singh, Renu Tyagi, S. K. Agarwal and D. Kanjilal, Materials Sci. and Engg. B86,228(2001).
Temperature dependent roughness of electronically excited InP surfaces, J.P.Singh, R. Singh, N.C. Mishra, V. Ganesan and D. Kanjilal, J. Appl. Phys. 90, 5968 (2001).
Boson localization and Mott insulator phase in NBCO films; Sanghamitra Khatua, P.K. Mishra, Ravi Kumar, V.C. Sahni and R. Pinto, J. of Phys. D; Appl. Phys. 34 (2001) 3327.
Recoil-Distance Method Lifetime Measurements in 173Ta; P.Joshi, G. Mukherjee, A.Kumar, R.P.Singh, S.Muralithar, S.K.Chamoli, C.R.Praharaj, U.Garg, R.K.Bhowmik, I.M.Govil; Phys.Rev. C64, 034303 (2001)
The automatic liquid nitrogen filling system for GDA detectors; Rakesh Kumar, A.J.Malyadri, S.Muralithar, Ruby Shanti, S.K.Saini, Kusum Rani, B.P.Ajith Kumar, Rajesh Kumar, and R.K.Bhowmik; Pramana 57, 1, 215 (2001)